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<p><b>Abstract</b>—Pseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detectable multiple stuck-at faults in the circuit and all detectable combinational faults within individual cones. Test pattern generators based on coding theory principles are not tailored to a specific circuit as they do not utilize any structural information. They usually generate test sets that are several orders of magnitude larger than the minimum size pseudoexhaustive test set required for a specific circuit. In this paper, we describe hardware efficient test pattern generators that employ knowledge of the circuit output cone structures for generating minimal test sets. Using our techniques, we have designed generators that generate minimum size test sets for the ISCAS benchmark circuits.</p>
Test pattern generators, linear feedback shift registers, pseudoexhaustive testing.
Sandeep K. Gupta, Rajagopalan Srinivasan, Melvin A. Breuer, "Novel Test Pattern Generators for Pseudoexhaustive Testing", IEEE Transactions on Computers, vol. 49, no. , pp. 1228-1240, November 2000, doi:10.1109/12.895939
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