Issue No. 01 - January (2000 vol. 49)

ISSN: 0018-9340

pp: 88-94

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.822567

ABSTRACT

<p><b>Abstract</b>—In some applications, it is desirable to find for a circuit a minimal partial description that allows a certain task to be carried out. A partial circuit description allows the task to be carried out more efficiently since fewer decision points exist based on a partial description compared to the full circuit description. We consider this problem with respect to finite state machines and the following tasks. Starting from a functional description of a finite state machine <tmath>$M$</tmath> in the form of a state table <tmath>$ST$</tmath>, we select a minimal subset of state-transitions <tmath>$ST_{part} \subset ST$</tmath> such that every output sequence that can be produced using state-transitions out of <tmath>$ST$</tmath> can also be produced using state-transitions out of <tmath>$ST_{part}$</tmath>. We also formulate a similar problem related to the propagation of fault effects from the inputs to the outputs of <tmath>$M$</tmath> and describe a procedure for solving this problem. Applications of these tasks include test generation for circuits described as interconnections of finite-state machines. Experimental results presented show that <tmath>$ST_{part}$</tmath> contains a small fraction of the state-transitions of <tmath>$ST$</tmath>.</p>

INDEX TERMS

Finite-state machines, minimal descriptions, test generation.

CITATION

Irith Pomeranz, Sudhakar M. Reddy, "On Finding a Minimal Functional Description of a Finite-State Machine for Test Generation for Adjacent Machines",

*IEEE Transactions on Computers*, vol. 49, no. , pp. 88-94, January 2000, doi:10.1109/12.822567