Issue No. 07 - July (1999 vol. 48)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.780879
<p><b>Abstract</b>—The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution.</p>
Built-in self-test, design for testability, fault diagnosis, multiple scan chains, scan-based design, test-response compaction.
J. Rajski and J. Tyszer, "Diagnosis of Scan Cells in BIST Environment," in IEEE Transactions on Computers, vol. 48, no. , pp. 724-731, 1999.