A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR
Issue No. 12 - December (1998 vol. 47)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.737687
<p><b>Abstract</b>—In this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR.</p>
Signature analysis, linear feedback shift register, aliasing, transient behavior, digital testing, VLSI.
M. S. Elsaholy, R. H. Seireg and S. I. Shaheen, "A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR," in IEEE Transactions on Computers, vol. 47, no. , pp. 1414-1417, 1998.