Issue No. 11 - November (1998 vol. 47)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.736428
<p><b>Abstract</b>—The paper presents an efficient scheme to compress and decompress in parallel deterministic test patterns for circuits with multiple scan chains. It employs a boundary-scan-based environment for high quality testing with flexible trade-offs between test data volume and test application time while achieving a complete fault coverage for any fault model for which test cubes are obtainable. It also reduces bandwidth requirements, as all test cube transfers involve compressed data. The test patterns are generated by the reseeding of a two-dimensional hardware structure which is comprised of a linear feedback shift register (LFSR), a network of exclusive-or (XOR) gates used to scramble the bits of test vectors, and extra feedbacks which allow including internal scan flip-flops into the decompressor structure to minimize the area overhead. The test data decompressor operates in two modes: pseudorandom and deterministic. In the first mode, the pseudorandom pattern generator (PRPG) is used purely as a generator of test vectors. In the latter case, variable-length seeds are serially scanned through the boundary-scan interface into the PRPG and parts of internal scan chains and, subsequently, a decompression is performed in parallel by means of the PRPG and selected scan flip-flops interconnected to form the decompression device. Extensive experiments with the largest ISCAS' 89 benchmarks show that the proposed technique greatly reduces the amount of test data in a cost effective manner.</p>
Boundary scan, built-in self-test, design for testability, reseeding of LFSRs, multiple scan chains, scan-based designs, test data decompression.
N. Zacharia, J. Tyszer and J. Rajski, "Test Data Decompression for Multiple Scan Designs with Boundary Scan," in IEEE Transactions on Computers, vol. 47, no. , pp. 1188-1200, 1998.