Issue No. 05 - May (1998 vol. 47)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.677235
<p><b>Abstract</b>—Recently, Matsuzawa and Fujiwara proposed a novel scheme to mask line faults of bus line circuits (such as address buses) due to short circuit defects between adjacent lines. In this paper, first we propose the fundamental theory and, then, present some efficient designs of these codes. Some lower and upper bounds for the optimal codes are also given.</p>
Bus line circuits, asymmetric error masking, constant weight codes, unordered codes, SEC-AUED codes.
B. Bose and L. G. Tallini, "Theory and Design of Adjacent Asymmetric Error Masking Codes," in IEEE Transactions on Computers, vol. 47, no. , pp. 544-555, 1998.