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Issue No. 08 - August (1996 vol. 45)
ISSN: 0018-9340
pp: 950-963
<p><b>Abstract</b>—The testing properties of a class of regular circuits called convergent trees are investigated. Convergent trees include such practical circuits as comparators, multiplexers, and carry-lookahead adders. The conditions for the testability of these tree circuits are derived for a functional fault model. The notion of L-testability is introduced, where the number of tests for a <it>p</it>-level tree is directly proportional to <it>p</it>, rather than exponential in <it>p</it>. Convergent trees that are C-testable (testable with a fixed number of tests, regardless of the tree's size) are also characterized. Two design techniques are also introduced that modify arbitrary tree modules in order to achieve L- and C-testability. Finally, we apply these techniques to the design of a large carry-lookahead adder.</p>
Testability, design-for-testability, synthesis-for-testability, C-testability, test generation, regular circuits, iterative logic arrays, tree circuits, functional testing.
John P. Hayes, R.D. (Shawn) Blanton, "Testability of Convergent Tree Circuits", IEEE Transactions on Computers, vol. 45, no. , pp. 950-963, August 1996, doi:10.1109/12.536237
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