Issue No. 06 - June (1996 vol. 45)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.506435
<p><b>Abstract</b>—The aim of this note is to present some counterexamples to the results in the paper by Du, Lyuu, and Hsu published in this Transactions [<ref rid="bibt07681" type="bib">1</ref>].</p>
Connectivity, diameter-vulnerability, fault-tolerance, line digraph iteration, spread.
M. Fiol, P. Morillo and C. Padró, "Comments on "Line Digraph Iterations and Connectivity Analysis of de Bruijn and Kautz Graphs"," in IEEE Transactions on Computers, vol. 45, no. , pp. 768, 1996.