Issue No. 06 - June (1996 vol. 45)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.506433
<p><b>Abstract</b>—This paper presents a new algorithm to generate test sets for single stuck-at faults, which also detect all multiple stuck-at faults in fan-out-free circuits. This algorithm derives the test set for each node in a fan-out-free circuit by calculating the output count of the node. The output count indicates the number of test patterns needed to check for all faults in the corresponding subcircuit. The fan-out-free circuit can be any combination of AND, OR, NOT, NAND, and NOR gates.</p>
Multiple faults, fan-out-free circuit, output count, test generation.
P. Lala and K. Lai, "Multiple Fault Detection in Fan-Out Free Circuits Using Minimal Single Fault Test Set," in IEEE Transactions on Computers, vol. 45, no. , pp. 763-765, 1996.