Issue No. 06 - June (1996 vol. 45)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.506429
<p><b>Abstract</b>—We provide test sets proportional to the sum of the two dimensions of the array for a large class of cells, which allow us to test rows (or columns) of cells of the array independently. Constant length test sets for array multipliers have been found under the single faulty cell model if the array is modified, and otherwise test sets are proportional to the number of cells. We can verify the full adder array of a combinational <it>n</it>×<it>m</it> multiplier in <it>O</it>(<it>n</it> + <it>m</it>) tests under the Multiple Faulty Cell (MFC) model. The entire multiplier, including the AND gates which generate the summands, can be verified after applying the same modifications which make the multiplier C-testable under the single faulty cell model.</p>
Iterative logic arrays, testing, multipliers, multiple faults, functional testing.
M. Schlag and F. J. Ferguson, "Detection of Multiple Faults in Two-Dimensional ILAs," in IEEE Transactions on Computers, vol. 45, no. , pp. 741-746, 1996.