Issue No. 04 - April (1996 vol. 45)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.494103
<p><b>Abstract</b>—The optimal codes <it>C</it>(<it>n</it>, <it>t</it>) capable of detecting <it>t</it>-unidirectional errors in an <it>n</it>-bit vector were defined by Borden. Unidirectional errors have been observed in modern digital devices such as PLA's, ROM's, and compact laser disks. In this paper, a new approach to designing self-testing checkers (STCs) for Borden codes is proposed. The new STC is built of a self-testing code-disjoint translator of the Borden code into the 1-out-of-<it>z</it> code (<it>z</it>≥ 2) and—if <it>z</it> = 3 or 4—an STC for the 1-out-of-<it>z</it> code. The translator is built of two multi-output threshold circuits with <tmath>$\lfloor n/2 \rfloor$</tmath> and <tmath>$\lceil n/2 \rceil$</tmath> inputs and a merging network. Compared to existing STC's for Borden codes the new checker generally uses significantly less hardware. It also enjoys a modular and highly regular structure which makes it attractive for VLSI implementation.</p>
Borden code, concurrent error detection, easily-testable circuit, multioutput threshold circuit, optimal t-unidirectional error detecting code, self-testing checker, unidirectional errors, unidirectional error detecting code.
S. J. Piestrak, "Design of Self-Testing Checkers for Borden Codes," in IEEE Transactions on Computers, vol. 45, no. , pp. 461-469, 1996.