Issue No. 03 - March (1996 vol. 45)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.485566
<p><b>Abstract</b>—To develop better ROM BIST techniques we first experimentally surveyed cell faults, word-line faults, bit-line faults, delay faults and other types of faults occurring in 1,000 faulty mask ROM chips. We found that most of the stuck-at faults were within a single mat. We then theoretically analyzed the aliasing probability for a mask ROM containing a fault or faults within a single mat. To experimentally evaluate BIST aliasing errors we implemented six MISRs on a custom board and observed actual aliasing errors. The experimentally measured aliasing probabilities agreed with the probabilities derived theoretically. No aliasing error occurred for the 16-stage, 8-input MISR.</p>
Built-in self-test, mask ROM, experimental faults analysis, aliasing probability, MISRs.
K. Iwasaki and S. Nakamura, "Aliasing Error for a Mask ROM Built-In Self-Test," in IEEE Transactions on Computers, vol. 45, no. , pp. 270-277, 1996.