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<p><b>Abstract</b>—Concurrent checkers are commonly used in computer systems to detect computational errors on-line, which enhances reliability. Using the coding theory framework developed earlier by the authors, it is shown in the following that concurrent checkers, already available within the circuit, can be utilized very effectively during off-line testing. Specifically, test time as well as fault escape probability can both be reduced simultaneously. The proposed combined scheme can be implemented with simple modification of existing hardware. Also shown is a novel use of BIST hardware for concurrent checking.</p><p>Specifically proposed is a novel, dual use of concurrent checkers and built-in self-test hardware, yielding mutual advantage.</p>
Built-in self-test, BIST, concurrent checking, fault-escape probability, parity prediction.
Dhiraj K. Pradhan, Sandeep K. Gupta, "Utilization of On-Line (Concurrent) Checkers during Built-In Self-Test and Vice Versa", IEEE Transactions on Computers, vol. 45, no. , pp. 63-73, January 1996, doi:10.1109/12.481487
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