Issue No. 05 - May (1995 vol. 44)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.381962
<p><it>Abstract</it>—In this paper, two equivalence proofs of yield modeling methods for defect-tolerant integrated circuits (ICs) are presented. These proofs are generalizations of those found in [<ref rid="BIBC07243" type="bib">3</ref>]; one of the proofs presented in this paper is valid for any defect-tolerant IC, while the other one is valid for defect-tolerant ICs with two levels of hierarchy.</p>
Defect tolerance, integrated circuits, yield modeling, mathematical proofs, model equivalence.
J. Houle, C. Thibeault and Y. Savaria, "Equivalence Proofs of Some Yield Modeling Methods for Defect-Tolerant Integrated Circuits," in IEEE Transactions on Computers, vol. 44, no. , pp. 724-728, 1995.