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<p>A new technique for estimating a tight lower bound of the detection probabilities for single faults at any internal signal line in a combinational circuit for random testing is presented. This lower bound is calculated from the detection probabilities of all single faults at the primary input lines in a linear time. The technique relies on the relationship between the detection probabilities of dominating and dominated faults in the considered combinational circuit.</p>
combinational circuits; fault diagnosis; logic testing; tight lower bounds; detection probabilities; single faults; internal signal lines; combinational circuits; random testing.

G. Redinbo and S. Ali, "Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits," in IEEE Transactions on Computers, vol. 43, no. , pp. 1426-1428, 1994.
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