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<p>A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead of conventionally used synchronizing sequences, to initialize the circuit. A procedure for computing homing sequences in sequential circuits, for which a state-table description is too large to be practical, is described, and experimental results are presented to demonstrate the effectiveness of the proposed test generation procedure.</p>
logic testing; sequential circuits; homing sequences; synchronous sequential circuit testing; test generation; sequential circuits; multiple observation times; detectable faults.

I. Pomeranz and S. Reddy, "Application of Homing Sequences to Synchronous Sequential Circuit Testing," in IEEE Transactions on Computers, vol. 43, no. , pp. 569-580, 1994.
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