Issue No. 04 - April (1994 vol. 43)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.278489
<p>Shows that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. The authors then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.</p>
logic testing; sequential circuits; logic arrays; combinatorial circuits; iterative logic arrays; sequential faults; test vectors; ILA; C-testability; M-testability; constant-length test sequence; pipelined array multiplier; iterative logic array; logic testing; sequential fault testing; test pattern generation.
C. Wu and C. Su, "Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns," in IEEE Transactions on Computers, vol. 43, no. , pp. 495-501, 1994.