Issue No. 12 - December (1993 vol. 42)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.260644
<p>A recursive technique for generating exhaustive patterns is presented. The method is optimal, i.e., in one experiment it covers exhaustively every block of k adjacent inputs in the first 2/sup k/ vectors. Implementation methods based on characteristic functions of test vectors are provided. They include a parallel pattern generator employing an exclusive-or array, and two serial generators that can be easily adopted in a scan-based built-in self-test environment.</p>
built-in self test; logic testing; recursive pseudoexhaustive test pattern generation; characteristic functions; test vectors; parallel pattern generator; exclusive-or array; serial generators; scan-based built-in self-test.
J. Rajski and J. Tyszer, "Recursive Pseudoexhaustive Test Pattern Generation," in IEEE Transactions on Computers, vol. 42, no. , pp. 1517-1521, 1993.