Issue No. 10 - October (1993 vol. 42)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.257710
<p>The Gamma interconnection network (GIN) is composed of 3*3 basic building blocks, with interconnecting patterns between stages following the plus-minus-2/sup i/ functions. The authors consider modifications to the GIN by altering the interconnecting patterns between stages so as to achieve high terminal reliability between any source-destination pair, resulting in the reliable GIN (REGIN). A type of REGIN's ensures totally disjoint paths in existence from any source to any destination, thereby capable of tolerating an arbitrary single fault. If several building blocks (i.e., 3*3 switches) are fabricated in one chip with very large scale integrated (VLSI) technology, the layout area and the pin count are less for the REGIN than for its GIN counterpart as a result of the change in the interconnecting patterns, giving rise to potential cost reduction. The terminal reliability of the REGIN is derived and compared with that of a compatible GIN. In addition, the performance of the REGIN is evaluated using simulation.</p>
disjoint paths; Gamma interconnection networks; high terminal reliability; source-destination pair; VLSI; layout area; pin count; simulation; performance; fault tolerant computing; multiprocessor interconnection networks; network routing; performance evaluation.
C. Wu, N. Tzeng and P. Chuang, "Creating Disjoint Paths in Gamma Interconnection Networks," in IEEE Transactions on Computers, vol. 42, no. , pp. 1247-1252, 1993.