Issue No. 07 - July (1993 vol. 42)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.237729
<p>The distributed self-diagnosis of a multiprocessor/multicomputer system based on interprocessor tests with imperfect fault coverage that permits intermittently faulty processors is addressed. Focusing on probabilistic diagnosis methods, the authors define several different categories of probabilistic diagnosis based on the type of fault syndrome information used in the diagnosis. Rigorous probabilistic analysis is then used to derive diagnosis algorithms optimal in terms of diagnostic accuracy for the diagnosis categories introduced. Analysis and simulations are used to evaluate the performance of the diagnosis algorithms introduced.</p>
performance evaluation; probabilistic distributed diagnosis schemes; distributed self-diagnosis; multiprocessor; multicomputer system; interprocessor tests; imperfect fault coverage; intermittently faulty processors; probabilistic diagnosis methods; fault syndrome information; diagnosis categories; simulations; diagnosis algorithms; fault tolerant computing; multiprocessing systems.
K. Shin and S. Lee, "Optimal and Efficient Probabilistic Distributed Diagnosis Schemes," in IEEE Transactions on Computers, vol. 42, no. , pp. 882-886, 1993.