Issue No. 06 - June (1993 vol. 42)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.277288
<p>It is shown that an n-input sorting network (SN) can be used to implement an n-variable symmetric threshold functions using the least amount of hardware. An algorithm to derive Boolean functions implemented on any line of any n-input threshold circuit T/sup n/ implemented as a SN is given. A heuristic procedure for generating the minimal test set for any threshold circuit T/sup n/ implemented as a Batcher's SN or any other SN is presented. The number of tests required to detect all stuck-at faults in an n-input SN is determined. A highly regular structure using only one type of simple cell and a suitability for low-level pipelining are other advantages of the circuit T/sup n/. The circuit T/sup n/ can be used as a basic building block of various circuitry supporting the use of all known unidirectional error detecting codes.</p>
minimal test set; multioutput threshold circuits; sorting networks; n-input; symmetric threshold functions; Boolean functions; threshold circuit; unidirectional error detecting codes; Boolean functions; logic circuits; logic testing; threshold logic.
S. Piestrak, "The Minimal Test Set for Multioutput Threshold Circuits Implemented as Sorting Networks," in IEEE Transactions on Computers, vol. 42, no. , pp. 700-712, 1993.