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<p>It is shown that one-dimensional, unilateral iterative logic arrays (ILAs) of combinational cells are C-testable for multiple sequential faults, provided the fault-free cell functions satisfy appropriate conditions. The test sequence is of length O((m/sup 2/n/sup 2/+mn/sup 3/)*K), where n (resp. m) is the number of signal values that can be applied to the horizontal (resp. vertical) cell input and K>or=n-1. Linear testability is also considered. The ripple-carry adder circuit (n=2, m=4) is shown to be C-testable with 699 test vectors.</p>
linear testability; testability; one-dimensional ILAs; multiple sequential faults; combinational cells; C-testable; fault-free cell functions; ripple-carry adder circuit; adders; logic arrays; logic testing.

A. Vergis, "On the Testability of One-Dimensional ILAs for Multiple Sequential Faults," in IEEE Transactions on Computers, vol. 41, no. , pp. 906-916, 1992.
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