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Issue No. 06 - June (1992 vol. 41)
ISSN: 0018-9340
pp: 779-786
<p>In comparison models for system-level fault diagnosis, pairs of units are given the same job and results are compared. The result of such a comparison test can be 0 (match) or 1 (mismatch) and diagnosis is based on the collection of test results. Two such models have been studied, among others: the symmetric model of K.Y. Chwa and S.L. Hakimi and the asymmetric model of M. Malek. The worst-case optimal testing algorithms for t-fault detection, sequential t-fault diagnosis, and one-step t-fault diagnosis in both models are presented. Nonadaptive and adaptive testing is discussed and it is shown that the latter often enables one to decrease the number of tests.</p>
nonadaptive testing; fault diagnosis; comparison models; optimal testing algorithms; fault detection; adaptive testing; fault location; fault tolerant computing; logic testing; multiprocessing systems.

A. Pelc, "Optimal Fault Diagnosis in Comparison Models," in IEEE Transactions on Computers, vol. 41, no. , pp. 779-786, 1992.
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