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<p>The concept of k-UCP circuits is proposed. In a k-UCP circuit, all stuck-at faults and stuck-open faults can be detected and located by k+1 and k(k+1)+1 tests, respectively, under the highly observable condition. A method of modifying an arbitrary combinational circuit into a k-UCP circuit is also proposed.</p>
testable design; logic circuits; highly observable condition; stuck-at faults; stuck-open faults; combinational circuit; combinatorial circuits; fault tolerant computing; integrated circuit testing; integrated logic circuits; logic testing.
W. Xiaoqing, K. Kinoshita, "A Testable Design of Logic Circuits Under Highly Observable Condition", IEEE Transactions on Computers, vol. 41, no. , pp. 654-659, May 1992, doi:10.1109/12.142692
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