Issue No. 11 - November (1990 vol. 39)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.61051
<p>A new class of data-compression techniques called group-theoretic signature analysis (GTSA) for testing a logic network is proposed, and the fault coverage of the method is analyzed. This method is a generalization of accumulator compression testing. Built-in-self-test for processor environments is feasible with GTSA.</p>
built-in self-test; data-compression techniques; group-theoretic signature analysis; testing; logic network; fault coverage; accumulator compression testing; processor environments; built-in self test; data compression; logic circuits; logic testing.
B. Bose, "Group Theoretic Signature Analysis," in IEEE Transactions on Computers, vol. 39, no. , pp. 1398-1403, 1990.