Issue No. 10 - October (1990 vol. 39)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.59858
<p>Test-pattern generation for high fault coverage is an expensive and time-consuming process. As an alternative circuits can be tested by applying random or pseudorandom patterns. To analyze random testing without fault simulation, the number of vectors that detect a fault in each fault class must be enumerated. A fault-detection function whose number of minterms is identical to the fault detectability is constructed. Extensions are made to the Cutting algorithm to evaluate the signal probability of the detection or its bounding functions. The signal probability can then be converted easily into an exact detectability or narrow detectability range associated with each fault.</p>
detection probability analysis; test pattern generation; circuit testing; random patterns; fault coverage; pseudorandom patterns; random testing; vectors; fault-detection function; minterms; fault detectability; Cutting algorithm; signal probability; bounding functions; exact detectability; narrow detectability; fault tolerant computing; integrated circuit testing; logic testing; probability.
R. David and K. Wagner, "Analysis of Detection Probability and Some Applications," in IEEE Transactions on Computers, vol. 39, no. , pp. 1284-1291, 1990.