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<p>An efficient partial scan technique called Ballast (balanced structure scant test) is presented. Scan path storage elements (SPSEs) are selected such that the remainder of the circuit has certain desirable testability properties. A complete test set is obtained using combinatorial automatic test pattern generation (ATPG). Some SPSEs may need to be provided with a HOLD mode; their number is minimized by ordering the registers in the scan path and formatting the test patterns appropriately. This methodology leads to a low area overhead and allows 100% coverage of irredundant faults.</p>
scan path storage elements; Ballast methodology; structured partial scan design; balanced structure scant test; testability properties; combinatorial automatic test pattern generation; automatic testing; combinatorial circuits; logic testing; sequential circuits.

M. Breuer, R. Gupta and R. Gupta, "The Ballast Methodology for Structured Partial Scan Design," in IEEE Transactions on Computers, vol. 39, no. , pp. 538-544, 1990.
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