Issue No. 03 - March (1990 vol. 39)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.48869
<p>The authors present the design of an 11-transistor combinational NMOS 1-out-of-3 code checker. The checker is totally self-checking (TSC) with respect to 36 faults out of a total of 58 faults defined at the NMOS switch and layout geometrical levels, and achieves the TSC goal of a checker for most of the fault sequences. The minimum fault sequences under which the TSC goal is lost are composed of at least three faults. This might be considered as a sufficient level of safety for some implementations.</p>
combinational totally self-checking 1-out-of-3 code checkers; NMOS; TSC goal; fault sequences; minimum fault sequences; automatic testing; integrated logic circuits; logic design; logic testing; MOS integrated circuits.
J. Lo and S. Thanawastien, "On the Design of Combinational Totally Self-Checking 1-out-of-3 Code Checkers," in IEEE Transactions on Computers, vol. 39, no. , pp. 387-393, 1990.