Issue No. 06 - June (1989 vol. 38)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.24297
The difficulty with the measurement of fault latency is due to the lack of observability of the fault occurrence and error generation instants in a production environment. The authors describe an experiment, using data from a VAX 11/780 under real workload, to study fault latency in the memory subsystem accurately. Fault latency distributions are generated for stuck-at-zero (s-a-0) and stuck-at
memory fault latency; fault latency; observability; fault occurrence; error generation; VAX 11/780; memory subsystem; fault tolerant computing; storage units; system recovery.
R. Chillarege and R. Iyer, "An Experimental Study of Memory Fault Latency," in IEEE Transactions on Computers, vol. 38, no. , pp. 869-874, 1989.