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Issue No. 06 - June (1989 vol. 38)
ISSN: 0018-9340
pp: 869-874
The difficulty with the measurement of fault latency is due to the lack of observability of the fault occurrence and error generation instants in a production environment. The authors describe an experiment, using data from a VAX 11/780 under real workload, to study fault latency in the memory subsystem accurately. Fault latency distributions are generated for stuck-at-zero (s-a-0) and stuck-at
memory fault latency; fault latency; observability; fault occurrence; error generation; VAX 11/780; memory subsystem; fault tolerant computing; storage units; system recovery.

R. Chillarege and R. Iyer, "An Experimental Study of Memory Fault Latency," in IEEE Transactions on Computers, vol. 38, no. , pp. 869-874, 1989.
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