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The number of (random) patterns required for random testing of RAMs (random-access memories), when classical fault models including pattern-sensitive faults are considered is determined. Markov chains are a powerful tool for this purpose. Single faults are considered first, and the influence of different parameters is analyzed. Double faults are then considered and arguments are presented to ex
random pattern testing; single faults; double faults; deterministic testing; RAMs; random-access memories; classical fault models; pattern-sensitive faults; Markov chains; parameters; multiple-coupling faults; test patterns; integrated circuit testing; Markov processes; random-access storage.

B. Courtois, A. Fuentes and R. David, "Random Pattern Testing Versus Deterministic Testing of RAMs," in IEEE Transactions on Computers, vol. 38, no. , pp. 637-650, 1989.
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