Issue No. 09 - September (1988 vol. 37)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.2271
A data compression technique called self-testable and error-propagating space compression is proposed and analyzed. Faults in a realization of Exclusive-OR and Exclusive-NOR gates are analyzed, and the use of these gates in the design of self-testing and error propagating space compressors is discussed. It is argued that the proposed data-compression technique reduce the hardware complexity in
fault analysis; data compression technique; built-in self-test; error-propagating space compression; Exclusive-OR; Exclusive-NOR; self-testing; BIST; automatic testing; data compression; logic testing.
M. Karpovsky, K. Saluja and S. Reddy, "A Data Compression Technique for Built-In Self-Test," in IEEE Transactions on Computers, vol. 37, no. , pp. 1151-1156, 1988.