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Issue No. 09 - September (1988 vol. 37)
ISSN: 0018-9340
pp: 1113-1121
Considers the design of two well-known optimal time adders: the carry look-ahead adder and the conditional sum adder. It is shown that 6 log/sub 2/(n)-4 and 6 log/sub 2/(n)+2 test patterns suffice to completely test the n-bit carry look-ahead adder and the n-bit conditional sum adder with respect to the single stuck-at fault model (for a given set of basic cells). The results are considered per
optimal time adders; carry look-ahead adder; conditional sum adder; VLSI chip; adders; integrated logic circuits; logic testing; VLSI.

B. Becker, "Efficient Testing of Optimal Time Adders," in IEEE Transactions on Computers, vol. 37, no. , pp. 1113-1121, 1988.
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