Issue No. 04 - April (1988 vol. 37)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.2199
A system's ability to recover quickly from transient errors is particularly important for systems that operate in hostile environments where bursts of high-frequency errors are likely. Evaluation of this ability poses a number of problems, including appropriate modeling of both the error-arrival process and the system's workload. These two problems are addressed in the context of a specific eva
workload effect; error recovery; random access memories; transient errors; error-arrival process; stochastic activity network model; fault location; random-access storage; stochastic processes.
J. Meyer and L. Wei, "Influence of Workload on Error Recovery in Random Access Memories," in IEEE Transactions on Computers, vol. 37, no. , pp. 500-507, 1988.