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A system's ability to recover quickly from transient errors is particularly important for systems that operate in hostile environments where bursts of high-frequency errors are likely. Evaluation of this ability poses a number of problems, including appropriate modeling of both the error-arrival process and the system's workload. These two problems are addressed in the context of a specific eva
workload effect; error recovery; random access memories; transient errors; error-arrival process; stochastic activity network model; fault location; random-access storage; stochastic processes.
J.F. Meyer, L. Wei, "Influence of Workload on Error Recovery in Random Access Memories", IEEE Transactions on Computers, vol. 37, no. , pp. 500-507, April 1988, doi:10.1109/12.2199
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