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A method of pseudoexhaustive test pattern generation is proposed that is suitable above all for circuits using random access scan. Two linear feedback shift registers are used to generate scan addresses and test patterns to be scanned into these addresses. It is shown that the method gives better results than random testing.
pseudoexhaustive test pattern generation; random access scan; linear feedback shift registers; scan addresses; feedback; integrated circuit testing; logic testing; shift registers.

P. Golan, P. Novak and J. Hlavicka, "Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage," in IEEE Transactions on Computers, vol. 37, no. , pp. 496-500, 1988.
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