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Issue No. 02 - February (1988 vol. 37)
ISSN: 0018-9340
pp: 237-239
A cost-effective method is presented for the deductive simulation of fault effects propagating through sequential functional modules that are described by the state-diagram representation of a Moore or Mealy automaton. The cornerstone of the method is a novel definition of the internal fault list of a sequential module. The method can be particularly useful for sequential modules when the state
deductive fault simulation; Moore automaton; sequential functional modules; state-diagram representation; Mealy automaton; internal fault list; failure analysis; finite automata; logic testing; sequential circuits; state-space methods.

K. Walczak, "Deductive Fault Simulation for Sequential Module Circuits," in IEEE Transactions on Computers, vol. 37, no. , pp. 237-239, 1988.
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