Issue No. 02 - February (1988 vol. 37)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.2153
A procedure for multiple-output combinational circuits is presented that yields the optimum space compressor while using counting for time compression. The procedure is intended for the built-in selftest environment where output response data compression is appropriate. Optimum is defined as the minimum number of error patterns missed by the combination of space and time compression. The proced
optimum syndrome space compression; multiple-output combinational circuits; counting for time compression; built-in selftest; output response data compression; fast Walsh transform; automatic testing; combinatorial circuits; data compression; logic testing; transforms; Walsh functions.
C.-H. Tung, J.P. Robinson, "A fast Algorithm for Optimum Syndrome Space Compression", IEEE Transactions on Computers, vol. 37, no. , pp. 228-232, February 1988, doi:10.1109/12.2153