Issue No. 02 - February (1988 vol. 37)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.2152
The generation of exhaustive test patterns for VLSI circuits using linear feedback shift registers is described in terms of cyclic codes. Punctured cyclic codes are used to generate exhaustive test patterns of any length. A techniques for the generation of punctured cyclic codes is presented. A technique is also presented to reduce the size of test sets obtained from punctured cyclic codes.
exhaustive test pattern generation; built-in self testing; VLSI circuits; linear feedback shift registers; punctured cyclic codes; automatic testing; codes; logic testing; VLSI.
C. Chen, "Exhaustive Test Pattern Generation Using Cyclic Codes," in IEEE Transactions on Computers, vol. 37, no. , pp. 225-228, 1988.