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The lifetimes of computer memories which are protected with single-error-correcting-double-error-detecting (SEC-DED) codes are studies. The authors assume that there are five possible types of memory chip failure (single-cell, row, column, row-column and whole chip), and, after making a simplifying assumption (the Poisson assumption), have substantiated that experimentally. A simple closed-form
single-error correcting double-error detecting codes; SEC-DED codes; reliability; single-error protected computer memories; lifetimes; memory chip failure; Poisson assumption; closed-form expression; mean time to failure; circuit reliability; error correction codes; error detection codes; life testing; semiconductor storage; statistical analysis.

R. McEliece, R. Goodman and M. Blaum, "The Reliability of Single-Error Protected Computer Memories," in IEEE Transactions on Computers, vol. 37, no. , pp. 114-119, 1988.
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