Issue No. 07 - July (1987 vol. 36)
null Wu-Tung Cheng , Engineering Research Center, AT&T
Previous papers have shown that a ripple carry adder composed of several full adder cells can be completely tested by a minimum test set of size 8 independent of the number of cells in the ripple carry adder under single faulty cell assumption. The fault model assumed is that faults in a cell can change the cell behavior in any arbitrary way, as long as the cell remains a combinational circuit. In this paper, we assume that any number of cells can be faulty at any time. A minimum test set of size 11 which can detect arbitrary length ripple carry adders under this fault model is presented. For general (N, p) adders in which each cell is a p-bit adder, a minimum test set of size 3 ? 22P - 1 is also presented.
testing, Adders, iterative logic arrays, minimum test set, multiple fault detection
n. Wu-Tung Cheng and J. Patel, "A Minimum Test Set for Multiple Fault Detection in Ripple Carry Adders," in IEEE Transactions on Computers, vol. 36, no. , pp. 891-895, 1987.