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Issue No. 05 - May (1987 vol. 36)
ISSN: 0018-9340
pp: 592-602
J. Savir , Data Systems Division, IBM Corporation
An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.
self-testing, Detection probability, embedded memory, fault detection, logic testing, Markov chain, random access memory, random patterns

S. Vecchio, J. Savir and W. McAnney, "Fault Propagation Through Embedded Multiport Memories," in IEEE Transactions on Computers, vol. 36, no. , pp. 592-602, 1987.
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