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Issue No. 12 - December (1986 vol. 35)
ISSN: 0018-9340
pp: 1086-1088
C.L. Chen , IBM
Linear feedback shift registers have been proposed to generate test patterns for the self-test of logic networks. The probability of linear dependence among k bit positions of a subset of k bits in a maximum length shift register sequence is an outstanding problem. In this correspondence, we derive a formula for the calculation of the probability.
test pattern generation, Linear feedback shift registers, self-test

C. Chen, "Linear Dependencies in Linear Feedback Shift Registers," in IEEE Transactions on Computers, vol. 35, no. , pp. 1086-1088, 1986.
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