Issue No. 11 - November (1986 vol. 35)
T. Fuja , School of Electrical Engineering, Cornell University
We describe and analyze row/column replacement, the technique currently used to control hard cell defects in semiconductor RAM's during manufacture. This strategy is shown to be asymptotically ineffective; it is demonstrated that this ineffectiveness may become a limiting issue for very large memory arrays.
yield improvement, Error-control coding, hard defects, RAM's, redundancy, reliability, row/column replacement
T. Fuja and C. Heegard, "Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's," in IEEE Transactions on Computers, vol. 35, no. , pp. 996-1000, 1986.