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Issue No.04 - April (1986 vol.35)
pp: 384-388
K.K. Saluja , Department of Electrical and Computer Engineering, University of Wisconsin
The problem of testing sequential machines using a checking experiment is investigated. An algorithm is given to augment sequential machines by adding extra input(s) to make them testable. We also present a circuit modification method, similar to scan methods, such that the augmented machine can be tested by the checking experiment. A justification of our method for a VLSI environment is given by determining the overheads.
testable design, Built-in self test, checking experiments, scan design, sequential machines
K.K. Saluja, R. Dandapani, "An Alternative to Scan Design Methods for Sequential Machines", IEEE Transactions on Computers, vol.35, no. 4, pp. 384-388, April 1986, doi:10.1109/TC.1986.1676776
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