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Issue No. 04 - April (1986 vol. 35)
ISSN: 0018-9340
pp: 384-388
K.K. Saluja , Department of Electrical and Computer Engineering, University of Wisconsin
ABSTRACT
The problem of testing sequential machines using a checking experiment is investigated. An algorithm is given to augment sequential machines by adding extra input(s) to make them testable. We also present a circuit modification method, similar to scan methods, such that the augmented machine can be tested by the checking experiment. A justification of our method for a VLSI environment is given by determining the overheads.
INDEX TERMS
testable design, Built-in self test, checking experiments, scan design, sequential machines
CITATION

R. Dandapani and K. Saluja, "An Alternative to Scan Design Methods for Sequential Machines," in IEEE Transactions on Computers, vol. 35, no. , pp. 384-388, 1986.
doi:10.1109/TC.1986.1676776
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