Issue No. 04 - April (1986 vol. 35)
K.G. Shin , Division of Computer Science and Engineering, Department of Electrical Engineering and Computer Science, University of Michigan
The time interval between the occurrence of a fault and the detection of the error caused by the fault is divided by the generation of that error into two parts: fault latency and error latency. Since the moment of error generation is not directly observable, all related works in the literature have dealt with only the sum of fault and error latencies, thereby making the analysis of their separate effects impossible. To remedy this deficiency, we 1) present a new methodology for indirectly measuring fault latency, 2) derive the distribution of fault latency from the methodology, and 3) apply the knowledge of fault latency to the analysis of two important examples.
maximum likelihood estimator, Detection time, fault and error latency, fault injection, hazard rate
K. Shin and n. Yann-Hang Lee, "Measurement and Application of Fault Latency," in IEEE Transactions on Computers, vol. 35, no. , pp. 370-375, 1986.