Issue No.07 - July (1985 vol.34)
In the above paper,1 the authors' photographs were inadvertently switched. The biographies and photographs should have appeared as follows.
"Correction to "Modeling and Test Generation Algorithms for MOS Circuits"", IEEE Transactions on Computers, vol.34, no. 7, pp. 680, July 1985, doi:10.1109/TC.1985.1676609