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Issue No. 03 - March (1985 vol. 34)
ISSN: 0018-9340
pp: 287-290
T.H. Spencer , Stanford University
ABSTRACT
This correspondence addresses actual implementation of a multiway fan-out and its effect on test generation. If a test generation ignores the fan-out implementation faults may be left undetected by the test set. Moreover, different implementations of the multiway fan-out may lead to different fault coverages. Careless implementation of the fan-out may also yield undetectable faults. Some guidelines for fan-out implementation that may enhance testability are given in this correspondence.
INDEX TERMS
reconvergent fan-out, Boolean difference, fan-out, layout, masking
CITATION
J. Savir, T.H. Spencer, "Layout Influences Testability", IEEE Transactions on Computers, vol. 34, no. , pp. 287-290, March 1985, doi:10.1109/TC.1985.1676573
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