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Issue No. 03 - March (1985 vol. 34)
ISSN: 0018-9340
pp: 284-287
K.K. Saluja , Department of Electrical and Computer Engineering, University of Newcastle
In this correspondence we consider the problem of test pattern generation for random-access memory to detect pattern-sensitive faults. A test algorithm is presented which contains a near-optimal WRITE sequence and is an improvement over existing algorithms. The algorithm is well suited for built-in testing applications.
static pattern-sensitive faults, Built-in testing, fault detection, pattern-sensitive faults, random-access memory

K. Kinoshita and K. Saluja, "Test Pattern Generation for API Faults in RAM," in IEEE Transactions on Computers, vol. 34, no. , pp. 284-287, 1985.
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