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Issue No. 02 - February (1985 vol. 34)
ISSN: 0018-9340
pp: 110-116
C.A. Papachristou , Department of Computer Engineering and Science, Case Western Reserve University
This paper presents an efficient test procedure for the detection of simultaneously present functional faults in semi-conductor random access memories (RAM's). The proposed procedure detects modeled types of functional faults using 36N + 24N log<inf>2</inf>N operations, which is an improvement over existing techniques. The testing process is twofold: first, it detects simple functional faults by a
random access memories (RAM's), Coupling faults, fault models, functional faults, memory testing

C. Papachristou and N. Sahgal, "An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories," in IEEE Transactions on Computers, vol. 34, no. , pp. 110-116, 1985.
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