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Issue No. 10 - October (1984 vol. 33)
ISSN: 0018-9340
pp: 947
null Kuang-Wei Chiang , Department of Electrical Engineering, University of Ottawa
This correspondence points out that the scope of application of the matrix model for MOS complex gates proposed by El-ziq and Su<sup>1</sup>does not cover general structures of this type. Also, an example is given to show that a complete detection test set for single stuck-at faults may not be able to detect all multiple faults in a fanout-free and irredundant MOS complex gate.
test generation, Fault detection, MOS logic circuits

n. Kuang-Wei Chiang and Z. Vranesic, "Comments on "Fault Diagnosis of MOS Combinational Networks"," in IEEE Transactions on Computers, vol. 33, no. , pp. 947, 1984.
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