Issue No. 08 - August (1984 vol. 33)
Teruhiko Yamada , C&C Systems Research Laboratories, NEC Corporation, Kawasaki, 213, Japan.
Takashi Nanya , C&C Systems Research Laboratories, NEC Corporation, Kawasaki, 213, Japan.; Department of Computer Science, Tokyo Institute of Technology, Tokyo, 152, Japan.
Undetectable bridging faults between two arbitrary leads, which may produce feedback loops, in a unate two-level irredundant AND-OR network are anlyzed and their effect on stuck-at fault detection tests is explored. As a result, any complete test set for single stuck-at faults proves to still remain valid in the presence of undetectable bridging faults.
T. Nanya and T. Yamada, "Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults," in IEEE Transactions on Computers, vol. 33, no. , pp. 758-761, 1984.